@conference {Schaffer:37,
	title = {Microscopic bulk damage in dielectric materials using nanojoule femtosecond laser pulses},
	year = {1999},
	publisher = {Quantum Electronics and Laser Science (with CLEO)},
	organization = {Quantum Electronics and Laser Science (with CLEO)},
	abstract = {We measure the thresholds for bulk damage and self-focusing in fused silica for 400-nm and 800-nm, 110-fs laser pulses. We find that optically observable damage can be produced with only 40 nJ of energy.},
	keywords = {Baltimore, MD},
	url = {/files/mazur/files/pub_37.pdf},
	author = {Schaffer, C. B. and A. Brodeur and N. Nishimura and Mazur, E.}
}
