Citation:C. B. Schaffer, A. Brodeur, N. Nishimura, and E. Mazur. 1999. “Microscopic bulk damage in dielectric materials using nanojoule femtosecond laser pulses.” In . Quantum Electronics and Laser Science (with CLEO). Download CitationBibTex Tagged XML Abstract:We measure the thresholds for bulk damage and self-focusing in fused silica for 400-nm and 800-nm, 110-fs laser pulses. We find that optically observable damage can be produced with only 40 nJ of energy.