Abstract:
The femtosecond time-resolved response of the spectral dielectric function provides a great wealth of information on carrier and lattice dynamics in highly photo-excited semiconductors. We present measurements of the dielectric function of crystalline and amorphous GaAs over a broad spectral energy range (1.7–3.4 eV), with sub- 100 fs time resolution. A detailed analysis of the data reveals many new insights into the dynamics and phase changes in semiconductors at high excitation fluences up to and beyond the damage threshold.