Microscopic bulk damage in dielectric materials using nanojoule femtosecond laser pulses

Publication information:

1999. “Microscopic Bulk Damage in Dielectric Materials Using Nanojoule Femtosecond Laser Pulses”

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We measure the thresholds for bulk damage and self-focusing in fused silica for 400-nm and 800-nm, 110-fs laser pulses. We find that optically observable damage can be produced with only 40 nJ of energy.