Thursday, January 27, 2011
Photonics West (San Francisco, CA)
We will present measurements of the complex nonlinear response of sputtered amorphous and polycrystalline titanium dioxide (TiO2) thin films using the thermally managed z-scan technique. Using a Ti:Sapphire laser with 100-fs pulses at 800 nm, we observe ultrafast electronic effects near TiO2's half band-gap. We explore the relation between material processing parameters and observed nonlinearity. In addition, we will discuss the consequences for applications such as all-optical switching.