Presentation Date:
Thursday, January 27, 2011
Location:
Photonics West (San Francisco, CA)
Presentation Slides:
We will present measurements of the complex nonlinear response of sputtered amorphous and polycrystalline titanium dioxide (TiO2) thin films using the thermally managed z-scan technique. Using a Ti:Sapphire laser with 100-fs pulses at 800 nm, we observe ultrafast electronic effects near TiO2's half band-gap. We explore the relation between material processing parameters and observed nonlinearity. In addition, we will discuss the consequences for applications such as all-optical switching.